Last modified on June 17, 2012, 12:15 am

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Supported by:


J÷rg Henkel, (Karlsruhe Institute of Technology (KIT), Germany)
Title: "Dependable Software for Undependable Hardware"

Short Bio: J÷rg Henkel is currently with Karlsruhe Institute of Technology (KIT), Germany, where he is directing the Chair for Embedded Systems CES. Before, he was with NEC Laboratories in Princeton, NJ. His current research is focused on design and architectures for embedded systems with focus on low power and reliability. Prof. Henkel has organized various embedded systems and low power ACM/IEEE conferences/ symposia as General Chair and Program Chair and was a Guest Editor on these topics in various Journals like the IEEE Computer Magazine. He was Program Chair of CODES'01, RSP'02, ISLPED/06, SIPS'08 and CASES'09, Estimedia'11, VLSI Design'12 and served as General Chair for CODES'02, ISLPED 2009 and Estimedia 2012. He is/has been a steering committee member of major conferences in the embedded systems field like at ICCAD, ISLPED, Codes+ISSS, CASES and is/has been an editorial board member of various journals like the IEEE TVLSI, IEEE TCAD, JOLPE etc. He has given full/half-day tutorials at leading conferences like DAC, ICCAD, DATE etc and has delivered several keynotes. Prof. Henkel received the 2008 DATE Best Paper Award, the 2009 IEEE/ACM William J. Mc Calla ICCAD Best Paper Award, the Codes+ISSS 2011 Best Paper Award and the MaXentric Technologies AHS 2011 Best Paper Award. He is the Chairman of the IEEE Computer Society, Germany Section, and the Editor-in-Chief of the ACM Transactions on Embedded Computing Systems (ACM TECS). He is an initiator and the coordinator of the German Research Foundation's (DFG) program on 'Dependable Embedded Systems' (SPP 1500). He holds ten US patents.

Abstract: As technology scales to 22nm and beyond, reliability becomes a serious concern of densely integrated on-chip systems. Aging effects like electro-migration, NBTI (Negative Bias Temperature Instability), TDDB (Time Dependent Dielectric Breakdown) and other effects alter the electric characteristics of circuits and lead finally to transient and/or permanent faults. High temperature often accelerates these effects and can be seen as a trigger for many known aging effects. But not only aging effects, also various kinds of particle strikes jeopardize reliability as CMOS technology scales to deep nano-scale. In fact, particle strikes may lead to transient bit-flips. All these effects are already observed today and will worsen with each upcoming technology node. So far, mostly physical-level and device-level techniques have been applied to control these negative effects that represent a major hurdle for further technology scaling. However, also architectural-level techniques have been successfully applied. Going even a step further up, we propose to include the whole software stack all the way up to the applications software to control these negative effects. We will show means in form of a few basic software transformations that can contribute to increase reliability in deep nano-scale systems. We emphasize the potential of cross-layer approaches and contribute to the paradigm "Reliable Software for Unreliable Hardware: Embedded Code Generation aiming at Reliability"

RenÚ Graf, (Siemens AG, Nuremberg, Germany)
Title: "Embedded systems in automation - Commodities and challenges"

Short Bio: Dr. RenÚ Graf studied Physics and received his PhD at the institute for robotics at the KIT. His research topics were both mobile robots and parallel kinematics, e.g. flight simulators. In his PhD thesis he combined these two systems in the way that the parallel kinematic compensates the accelerations of the moving robot. The result is an acceleration free transport system. In 2001 he joined Siemens and worked on the development of several series of Simatic S7 PLCs. Three years ago he became group leader in the department of pre-development and research on automation systems (ATS) of the divisions IA and DT. His work focusses both on real time operating systems for automation devices and on development and validation of embedded systems in common. Another research topic are the consequences of using multi core processors for hard real time applications due to real parallelism. His group develops and provides a hard real time capable Linux, which operates in several products of the Siemens automation portfolio. Furthermore, eclipse as development environment and application platform is evaluated and supported.

Abstract: Automation is just one application field of embedded systems, but surely one of the most heterogeneous ones. Automation systems can be found in very different places like traffic control, home and building automation, but also in industrial scenarios like production of cars or petrochemical plants. The first part of the keynote will take the audience on a journey through this variety. Both real time requirements and applications of these domains will be presented.

Furthermore, common trends like multicore processors enter the field of automation systems as well, but the consequences of using multicore processors in hard real time devices are not understood completely so far. The second part of the keynote will present a real life example of loosing performance by using two cores instead of one. The most important conclusion is that hardware and software have implicit dependencies, which have to be considered in the very early system design phase.